UE Advanced characterization for nanostructures

Diplômes intégrant cet élément pédagogique :


This course will be dedicated to advanced characterization techniques of nanostructures. It will cover electron microscopy techniques (electron diffraction, loss spectroscopy, imaging), X ray spectroscopy and scattering techniques and Synchrotron radiation measurements.


X-ray scattering (from single electron to periodic material, anomalous scattering)
Reciprocal space (reminder +
Surface sensitive X-ray scattering
X-ray absorption fine structure
Examples of application : strain and composition determination, in situ studies of growth
Introduction to the X-ray synchrotron radiation production (including the forth generation source like the ESRF Extremely Brilliant Source)
Coherent X-ray scattering and X-ray photon correlation spectroscopy
The basis of electron microscopy
Electron diffraction and Electron loss Spectroscopy
Imaging and chemical sensitivity (Transmission Electron Microscopy and Scanning Transmission Electron Microscopy)
Case studies

Informations complémentaires

Lieu(x) : Grenoble
Langue(s) : Anglais