UE Advanced characterization for Nanostructures

This course will be dedicated to advanced characterization techniques of nanostructures. It will cover electron microscopy techniques (electron diffraction, loss spectroscopy, imaging), X ray spectroscopy and scattering techniques and Synchrotron radiation measurements.

Content

X-ray scattering (from single electron to periodic material, anomalous scattering)
Reciprocal space (reminder +
Surface sensitive X-ray scattering
X-ray absorption fine structure
Examples of application : strain and composition determination, in situ studies of growth
Introduction to the X-ray synchrotron radiation production (including the forth generation source like the ESRF Extremely Brilliant Source)
Coherent X-ray scattering and X-ray photon correlation spectroscopy
The basis of electron microscopy
Electron diffraction and Electron loss Spectroscopy
Imaging and chemical sensitivity (Transmission Electron Microscopy and Scanning Transmission Electron Microscopy)
Case studies