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    UE Physical measurements at nanoscale by local probes

    • Level

      Baccalaureate +4

    • ECTS

      3 credits

    • Component

      UFR PhITEM (physique, ingénierie, terre, environnement, mécanique)

    • Semester

      Printemps

    Description

    Goal: Introduction to local probes techniques in the field of nanosciences and nanotechnologies.

    Content

    1. Introduction to Scanning Probes Microscopy (1h30)

    • Comparison between surface analysis techniques: SEM/TEM, SFA
    • Presentation of the SPM sub-families: STM / SFM / SNOM via examples of applications

    2. The Scanning Tunneling Microscope (7h)

    • The tunneling effect
      • STM relevant parameters
      • Expression of the tunneling current
    • The STM instrument
      • Tip fabrication methods
      • Electronic and instrumental chain to measure and control tunnelling current in the pico/nano-ampere range ADC/DAC, I/V converter, lock-in amplifier
      • Source of noises and detection limit
      • Vibration isolation (tutorial on transfer function and damping)
      • Measurement at low temperature : how to operate an STM in a cryostat>
    • Operating STM modes and associated measurements
      • Local density of states (LDOS) and I/V spectroscopy
      • Constant current mode versus constant height mode

    3. The Atomic Force Microscope (12h)

    • Why mechanical oscillators
      • Introduction and history
      • Mechanical susceptibility
      • Limits of sensitivity (readout noise and Brownian motion)
      • Working at resonance, decrease the size/mass
    • How to build an AFM
      • Micro fabrication of cantilever and tips
      • Nano positioning (piezo material and issues with them as hysteresis…)
      • Precision position measurements (optical and capacitive)
      • Signal analysis (Homodyne detection, PLL and PID)
    • Operating AFMs
      • Calibration process (cantilever stiffness, position detection)
      • What physical values are accessible (van der Waals, electrical, magnetic, friction forces)
      • Different modes of operation
    • Maps analysis and image processing
      • Surface analysis parameters: rms, ra, skewness, kurtosis, etc
      • Artefacts, tip dilation effect
      • Tilt correction via polynomial subtraction and color scale
      • Tutorial on processing of the images and spectroscopy curves obtained in PW via Gwyddion software
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    Course parts

    • CMLectures (CM)22h
    • UE Physical measurements at nanoscale by local probes - TPPractical work (TP)8h

    Period

    Semester 8