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Degrees incorporating this pedagocial element :
Description
Goal: Introduction to local probe techniques in Nanosciences.
Part 1: Scanning Tunneling Microscopy and its applications, near-field microscopies instrumentation
Chapter 1: Scanning Tunneling Microscopy
Refresher on the free electron model in a metal, including the work-function basis.
Basics on electron tunneling though a square barrier.
Field emission in the framework of the WKB approximation.
Microscopic model of tunneling.
Expression of the tunnel current as a function of the density of states and electronic distribution function.
General description of STM.
Chapter 2: Instrumentation for Scanning Probe Microscopy
Chapter 3: STM imaging of surfaces
Chapter 4: Scanning tunneling spectroscopy of nano-objects and nanostructures
Principles of local spectroscopy and spectroscopic imaging
Chapter 5: Nanomanipulation
Chapter 6: New local probes. Combined AFM-STM
Part 2: Atomic Force Microscopy and related techniques
Chapter 1: Principles of AFM
Chapter 2: Imaging modes
Chapter 3: Spectroscopy mode. Force curves and related interaction measurements, Force mapping
Chapter 4: Introduction to Electric Force Microscopy
Chapter 5: AFM as a local tool
Recommended prerequisite
Quantum mechanics, solid-state physics, Basic mechanics
Courses offered by :
In brief
Period : Semestre 8Credits : 3
Number of hours
- Cours magistral - Travaux dirigés : 27h
Language(s) : English
