Diplômes intégrant cet élément pédagogique :
Descriptif
Goal: Introduction to local probe techniques in Nanosciences.
Part 1: Scanning Tunneling Microscopy and its applications, near-field microscopies instrumentation
Chapter 1: Scanning Tunneling Microscopy
Refresher on the free electron model in a metal, including the work-function basis.
Basics on electron tunneling though a square barrier.
Field emission in the framework of the WKB approximation.
Microscopic model of tunneling.
Expression of the tunnel current as a function of the density of states and electronic distribution function.
General description of STM.
Chapter 2: Instrumentation for Scanning Probe Microscopy
Chapter 3: STM imaging of surfaces
Chapter 4: Scanning tunneling spectroscopy of nano-objects and nanostructures
Principles of local spectroscopy and spectroscopic imaging
Chapter 5: Nanomanipulation
Chapter 6: New local probes. Combined AFM-STM
Part 2: Atomic Force Microscopy and related techniques
Chapter 1: Principles of AFM
Chapter 2: Imaging modes
Chapter 3: Spectroscopy mode. Force curves and related interaction measurements, Force mapping
Chapter 4: Introduction to Electric Force Microscopy
Chapter 5: AFM as a local tool
Pré-requis
Quantum mechanics, solid-state physics, Basic mechanics
Informations complémentaires
Lieu(x) : Grenoble - Domaine universitaireLangue(s) : Anglais
Formation proposée par :
En bref
Période : Semestre 8Crédits : 3
Volume horaire TD : 27h
Code Apogée :PAX8NAAC
